Analytische Transmissions- elektronenmikroskopie

Jürgen Thomas arbeitet seit vielen
Jahren auf dem Gebiet der analy-
tischen Transmissionselektronen-
mikroskopie. Sie umfasst die kon-
ventionelle (Ruhebild-) Abbildung,
verschiedene Varianten der
Elektronenbeugung, die Hochauf-
lösungsmikroskopie (HRTEM), die
Rastertransmissionselektronen-
mikroskopie (STEM) sowie die ana-
lytischen Verfahren energiedisper-
sive Röntgenspektroskopie (EDXS)
und Elektronenenergieverlust-
Spektroskopie (EELS).
Während seiner Arbeit, insbeson-
dere im Rahmen seiner Lehrtätig-
keit, hat er Erfahrungen bei der
Wissensvermittlung gesammelt,
die in ein Buch über analytische
Transmissionselektronenmikro-
skopie eingeflossen sind, das er
gemeinsam mit Dr. Thomas
Gemming geschrieben hat.
Dieses Lehrbuch ist sowohl in
deutscher als auch in englischer
Sprache erschienen und bietet
eine praxisnahe, klare und ver-
ständliche Einführung für all
jene, die für ihre Arbeit das Trans-
missionselektronenmikroskop
verwenden wollen.

Analytical transmission electron microscopy

Jürgen Thomas has been working
in the field of analytical trans-
mission electron microscopy for
many years.
It includes conventional (fixed
beam) imaging, different variants
of electron diffraction, high
resolution electron microscopy
(HRTEM), scanning transmission
electron microscopy (STEM) as well
as the analytical methods energy
dispersive X-ray spectroscopy
(EDXS) and electron energy loss
spectroscopy (EELS).
During his work, especially in the
context of his teaching, he attained
experiences for explanations of
construction, function, and specialities
of transmission electron microscopes
and microscopy which are integrated
in a textbook about these topics
written by him together with
Dr. Thomas Gemming.
This book is published in German
as well as in English. It is practically
oriented and offers a clear and
understandable introduction for all
persons who want to use a
transmission electron microscope.

ISBN 978-94-017-8600-3

Dr. Jürgen Thomas

Department:IKM - Micro- and Nanostructures
Address:IFW Dresden
Helmholtzstraße 20
01069 Dresden
Telephone number:+49-351-4659-250
E-mail:J.Thomas(at)ifw-dresden.de



                                                               Room: A 1E.05.2

 

 

 

Journal papers:110
Contributions to collected editions/proceedings:29
Invited talks:24
Monographs:2

Journal papers

2016

M. Goettlicher, M. Rohnke, A. Kunz, J. Thomas, R.A. Henning, T. Leichtweiss, T. Gemming, J. Janek: Anodization of titanium in radio frequency oxygen discharge - Microstructure, kinetics & transport mechanism, Solid State Ionics 290 (2016), S. 130-139 URL

P.V. Leksin, A.A. Kamashev, J. Schumann, V.E. Kataev, J. Thomas, B. Buechner, I.A. Garifullin: Boosting the superconducting spin valve effect in a metallic superconductor/ferromagnet heterostructure, Nano Research 9 (2016) Nr. 4, S. 1005-1011 URL

P.V. Leksin, N.N. Garif'yanov, A.A. Kamashev, A.A. Validov, Y.V. Fominov, J. Schumann, V. Kataev, J. Thomas, B. Buechner, I.A. Garifullin: Isolation of proximity-induced triplet pairing channel in a superconductor/ferromagnet spin valve, Physical Review B 93 (2016) Nr. 10, S. 100502/1-5 URL

2015

M. Samadi Khoshkhoo, S. Scudino, T. Gemming, J. Thomas, J. Freudenberger, M. Zehetbauer, C.C. Koch, J. Eckert: Nanostructure formation mechanism during in-situ consolidation of copper by room-temperature ball milling, Materials and Design 65 (2015), S. 1083-1090 URL

2014

V. Brackmann, V. Hoffmann, A. Kauffmann, A. Helth, J. Thomas, H. Wendrock, J. Freudenberger, T. Gemming, J. Eckert: Glow discharge plasma as a surface preparation tool for microstructure investigations, Materials Characterization 91 (2014), S. 76-88 URL

A. Teresiak, M. Uhlemann, J. Thomas, J. Eckert, A. Gebert: Influence of Co and Pd on the formation of nanostructured LaMg2Ni and its hydrogen reactivity, Journal of Alloys and Compounds 582 (2014), S. 647-658 URL

M. Zier, F. Scheiba, S. Oswald, J. Thomas, D. Goers, T. Scherer, M. Klose, H. Ehrenberg, J. Eckert: Lithium dendrite and solid electrolyte interphase investigation using OsO4, Journal of Power Sources 266 (2014), S. 198-207 URL

2013

E.M.M. Ibrahim, S. Hampel, R. Kamsanipally, J. Thomas, K. Erdmann, S. Fuessel, C. Taeschner, V.O. Khavrus, T. Gemming, A. Leonhardt, B. Buechner: Highly biocompatible superparamagnetic Ni nanoparticles dispersed in submicron-sized C spheres, Carbon 63 (2013), S. 358-366 URL

M. Samadi Khoshkhoo, S. Scudino, J. Thomas, T. Gemming, H. Wendrock, J. Eckert: Size evaluation of nanostructured materials, Materials Letters 108 (2013), S. 343-345 URL

K. Pinkert, L. Giebeler, M. Herklotz, S. Oswald, J. Thomas, A. Meier, L. Borchardt, L. Kaskel, H. Ehrenberg, J. Eckert: Functionalised porous nanocomposites: Amultidisciplinary approach to investigate designed structures for supercapacitor applications, Journal of Materials Chemistry A 1 (2013) Nr. 5, S. 4904-4910 URL

J. Thomas, J. Ramm, T. Gemming: Density measurement of thin layers by electron energy loss spectroscopy (EELS), Micron 50 (2013), S. 57-61 URL

F. Thoss, L. Giebeler, J. Thomas, S. Oswald, K. Potzger, H. Reuther, H. Ehrenberg, J. Eckert: Amorphous Li-Al-based compounds: A novel approach for designing high performance electrode materials for Li-Ion batteries, Inorganics 1 (2013), S. 14-31 URL

D. Wadewitz, W. Gruner, M. Herklotz, M. Klose, L. Giebeler, A. Voss, J. Thomas, T. Gemming, J. Eckert, H. Ehrenberg: Investigation of copper-cobalt-oxides as model systems for composite interactions in conversion-type electrodes for Lithium-Ion batteries, Journal of the Electrochemical Society 160 (2013) Nr. 8, S. A1333-A1339 URL

2012

A. Bajpai, S. Gorantla, M. Loeffler, S. Hampel, M.H. Ruemmeli, J. Thomas, M. Ritschel, T. Gemming, B. Buechner, R. Klingeler: The filling of carbon nanotubes with magnetoelectric Cr2O3, Carbon 50 (2012) Nr. 4, S. 1699-1712 URL

M. Dimitrakopoulou, S. Gorantla, J. Thomas, T. Gemming, G. Cuniberti, B. Buechner, M.H. Ruemmeli: Understanding the growth of amorphous SiO2 nanofibers and crystalline binary nanoparticles produced by laser ablation, Nanotechnology 23 (2012) Nr. 3, S. 35601/1-8 URL

E.M.M. Ibrahim, S. Hampel, J. Thomas, D. Haase, A.U.B. Wolter, V.O. Khavrus, C. Taeschner, A. Leonhardt, B. Buechner: Synthesis of superparamagnetic nanoparticles dispersed in spherically shaped carbon nanoballs, Journal of Nanoparticle Research 14 (2012) Nr. 9, S. 1118/1-9 URL

A.H. Taghvaei, M. Stoica, M.S. Khoshkhoo, J. Thomas, G. Vaughan, K. Janghorban, J. Eckert: Microstructure and magnetic properties of amorphous/nanocrystalline Co40Fe22Ta8B30 alloy produced by mechanical alloying, Materials Chemistry and Physics 134 (2012), S. 1214-1224 URL

J. Thomas, J. Ramm, T. Gemming: Elektronenbeugung zur Analyse duenner Funktionsschichten: Standardmethode im Transmissionselektronenmikroskop, Vakuum in Forschung und Praxis 24 (2012) Nr. 6, S. 30-33 URL

2011

W. Gruner, J. Thomas, L. Giebeler, H. Ehrenberg, D. Wadewitz: Interactions of copper and iron in conversion reactions of nanosized oxides with large variations in iron-copper ratio, Journal of the Electrochemical Society 158 (2011) Nr. 12, S. A1383-A1392 URL

A. Jacquot, J. Thomas, J. Schumann, M. Jaegle, H. Boettner, T. Gemming, J. Schmidt, D. Ebling: (Bi,Sb)2Te3-PbTe chalcogenide alloys: Impact of the cooling rate and sintering parameters on the microstructures and thermoelectric performances, Journal of Materials Research 26 (2011) Nr. 15, S. 1773-1784 URL

M. Samadi Khoshkhoo, S. Scudino, J. Thomas, K.B. Surreddi, J. Eckert: Grain and crystallite size evaluation of cryomilled pure copper, Journal of Alloys and Compounds 509 (2011) Nr. Supplement 1, S. S343-S347 URL

O. Khvostikova, H. Hermann, H. Wendrock, T. Gemming, J. Thomas, H. Ehrenberg: Effect of the microstructure on the intercalation and exfoliation behaviour of graphite, Journal of Materials Science 46 (2011) Nr. 8, S. 2422-2430 URL

2010

A. Bajpai, P. Borisov, S. Gorantla, R. Klingeler, J. Thomas, T. Gemming, W. Kleemann, B. Buechner: Interface-driven magnetoelectric effects in granular CrO2, epl 91 (2010) Nr. 1, S. 17006/1-6 URL

F. Boerrnert, S. Gorantla, A. Bachmatiuk, J.H. Warner, I. Ibrahim, J. Thomas, T. Gemming, J. Eckert, G. Cuniberti, B. Buechner, M.H. Ruemmeli: In situ observations of self-repairing single-walled carbon nanotubes, Physical Review B 81 (2010) Nr. 20, S. 201401(R)/1-4 URL

F. Boerrnert, C. Boerrnert, S. Gorantla, X. Liu, A. Bachmatiuk, J.-O. Joswig, F.R. Wagner, F. Schaeffel, J.H. Warner, R. Schoenfelder, B. Rellinghaus, T. Gemming, J. Thomas, M. Knupfer, B. Buechner, M.H. Ruemmeli: Single-wall-carbon-nanotube/single-carbon-chain molecular junctions, Physical Review B 81 (2010) Nr. 8, S. 85439/1-5 URL

S. Gorantla, F. Boerrnert, A. Bachmatiuk, M. Dimitrakopoulou, R. Schoenfelder, F. Schaeffel, J. Thomas, T. Gemming, E. Borowiak-Palen, J.H. Warner, B.I. Yakobson, J. Eckert, B. Buechner, M.H. Ruemmeli: In situ observations of fullerene fusion and ejection in carbon nanotubes, Nanoscale 2 (2010) Nr. 10, S. 2077-2079 URL

S. Gorantla, S. Avdoshenko, F. Boerrnert, A. Bachmatiuk, M. Dimitrakopoulou, F. Schaeffel, R. Schoenfelder, J. Thomas, T. Gemming, J.H. Warner, G. Cuniberti, J. Eckert, B. Buechner, M.H. Ruemmeli: Enhanced pi-pi interactions between a C60 fullerene and a buckle bend on a double-walled carbon nanotube, Nano Research 3 (2010) Nr. 2, S. 92-97 URL

M.H. Lee, K.S. Lee, J. Das, J. Thomas, U. Kuehn, J. Eckert: Improved plasticity of bulk metallic glasses upon cold rolling, Scripta Materialia 62 (2010) Nr. 9, S. 678-681 URL

F. Lipps, F. Pezzoli, M. Stoffel, C. Deneke, J. Thomas, A. Rastelli, V. Kataev, O.G. Schmidt, B. Buechner: Electron spin resonance study of Si/SiGe quantum dots, Physical Review B 81 (2010) Nr. 12, S. 125312/1-9 URL

F. Lipps, F. Pezzoli, M. Stoffel, C. Deneke, J. Thomas, A. Rastelli, V. Kataev, O.G. Schmidt, B. Buechner: Identifying spins states on self assembled Si/SiGe quantum dots by means of ESR, Journal of Physics: Conference Series 245 (2010) Nr. 1, S. 12026/1-4 URL

N. Mattern, T. Gemming, J. Thomas, G. Goerigk, H. Franz, J. Eckert: Phase separation in Ni–Nb–Y metallic glasses, Journal of Alloys and Compounds 495 (2010) Nr. 2, S. 299-304 URL

R. Schaarschuch, M. Reibold, S. Haindl, V. Neu, J. Thomas, T. Gemming, C.-G. Oertel, B. Holzapfel, L. Schultz, W. Skrotzki: Textured growth and microstructure of pulsed laser deposited Nb/Cr/SmCo5 hybrid structures, Physica Status Solidi A 207 (2010) Nr. 8, S. 1785-1791 URL

L. de Abreu Vieira, M. Doebeli, A. Dommann, E. Kalchbrenner, A. Neels, J. Ramm, H. Rudigier, J. Thomas, B. Widrig: Approaches to influence the microstructure and the properties of Al–Cr–O layers synthesized by cathodic arc evaporation, Surface and Coatings Technology 204 (2010), S. 1722-1728 URL

2009

M. Bystrzejewski, A. Bachmatiuk, J. Thomas, P. Ayala, H.-W. Huebers, T. Gemming, E. Borowiak-Palen, T. Pichler, R.J. Kalenczuk, B. Buechner, M.H. Ruemmeli: Boron doped carbon nanotubes via ceramic catalysts, Physica Status Solidi RRL 3 (2009) Nr. 6, S. 193-195 URL

C. Deneke, J. Schumann, R. Engelhard, J. Thomas, C. Mueller, M.S. Khatri, A. Malachias, M. Weisser, T.H. Metzger, O.G. Schmidt: Structural and magnetic properties of an InGaAs/Fe3Si superlattice in cylindrical geometry, Nanotechnology 20 (2009) Nr. 4, S. 45703/1-5 URL

C. Hossbach, S. Teichert, J. Thomas, L. Wilde, H. Wojcik, D. Schmidt, B. Adolphi, M. Bertram, U. Muehle, M. Albert, S. Menzel, B. Hintze, J.W. Bartha: Properties of plasma-enhanced atomic layer deposition-grown tantalum carbonitride thin films, Journal of the Electrochemical Society 156 (2009) Nr. 11, S. H 852-H 859 URL

M.H. Lee, J.K. Lee, K.T. Kim, J. Thomas, J. Das, U. Kuehn, J. Eckert: Deformation-induced microstructural heterogeneity in monolithic Zr44Ti11Cu9.8Ni10.2Be25 bulk metallic glass, Physica Status Solidi RRL 3 (2009) Nr. 2-3, S. 46-48 URL

S.B. Menzel, J. Thomas, U. Weissker, F. Schaeffel, C. Hossbach, M. Albert, S. Hampel, T. Gemming: Preparation of CNT-copper matrix composite films, Journal of Nanoscience and Nanotechnology 9 (2009), S. 6096-6103 URL

A. Teresiak, M. Uhlemann, A. Gebert, J. Thomas, J. Eckert, L. Schultz: Formation of nanostructured LaMg2Ni by rapid quenching and intensive milling and its hydrogen reactivity, Journal of Alloys and Compounds 481 (2009) Nr. 1-2, S. 144-151 URL

A. Teresiak, M. Uhlemann, J. Thomas, A. Gebert: The metastable Mg6Ni phase - Thermal behaviour, crystal structure and hydrogen reactivity of the rapidly quenched alloy, Journal of Alloys and Compounds 475 (2009) Nr. 1-2, S. 191-197 URL

J. Thomas, J. Schumann, H. Vinzelberg, E. Arushanov, R. Engelhard, O.G. Schmidt, T. Gemming: Epitaxial Fe3Si films on GaAs(100) substrates by means of electron beam evaporation, Nanotechnology 20 (2009) Nr. 23, S. 235604/1-9 URL

2008

C. Deneke, J. Schumann, R. Engelhard, J. Thomas, W. Sigle, U. Zschieschang, H. Klauk, A. Chuvilin, O.G. Schmidt: Fabrication of radial superlattices based on different hybrid materials, Physica Status Solidi C 5 (2008) Nr. 9, S. 2704-2708 URL

D. Elefant, R. Schaefer, J. Thomas, H. Vinzelberg, C.M. Schneider: Competition of spin-flip and spin-flop dominated processes in magnetic multilayers: Magnetization reversal, magnetotransport, and domain structure in the NiFe/Cu system, Physical Review B 77 (2008) Nr. 1, S. 14426/1-11 URL

S. Hampel, D. Kunze, D. Haase, K. Kraemer, M. Rauschenbach, M. Ritschel, A. Leonhardt, J. Thomas, S. Oswald, V. Hoffmann, B. Buechner: Carbon nanotubes filled with a chemotherapeutic agent: a nanocarrier mediates inhibition of tumor cell growth, Nanomedicine 3 (2008) Nr. 2, S. 175-182 URL

K. Leistner, H. Schloerb, J. Thomas, L. Schultz, S. Faehler: Remanence enhancement in nanoscaled electrodeposited FePt films, Applied Physics Letters 92 (2008) Nr. 5, S. 52502/1-3 URL

M. Spindler, S.B. Menzel, C. Eggs, J. Thomas, T. Gemming, J. Eckert: TEM investigation of Ti and Ti/Al bilayer as alternative diffusion barriers for Cu metallization for SAW device applications, Microelectronic Engineering 85 (2008) Nr. 10, S. 2055-2058 URL

M. Stangl, M. Liptak, A. Fletcher, J. Acker, J. Thomas, H. Wendrock, S. Oswald, K. Wetzig: Influence of initial microstructure and impurities on Cu room-temperature recrystallization (self-annealing), Microelectronic Engineering 85 (2008) Nr. 3, S. 534-541 URL

H. Vinzelberg, J. Schumann, D. Elefant, R.B. Gangineni, J. Thomas, B. Buechner: Low temperature tunneling magnetoresistance on (La,Sr)MnO3/Co junctions with organic spacer layers, Journal of Applied Physics 103 (2008) Nr. 9, S. 93720/1-5 URL

2007

K. Bartsch, B. Arnold, R. Kaltofen, C. Taeschner, J. Thomas, A. Leonhardt: Effects of catalyst pre-treatment on the growth of single-walled carbon nanotubes by microwave CVD, Carbon 45 (2007) Nr. 3, S. 543-552 URL

D. Haase, S. Hampel, A. Leonhardt, J. Thomas, N. Mattern, B. Buechner: Facile one-step-synthesis of carbon wrapped copper nanowires by thermal decomposition of Copper(II)–acetylacetonate, Surface and Coatings Technology 201 (2007) Nr. 22-23, S. 9184-9188 URL

R. Mueller, M. Bobeth, H. Brumm, G. Gille, W. Pompe, J. Thomas: Kinetics of nanoscale structure development during Mg-vapour reduction of tantalum oxide, International Journal of Materials Research (Zeitschrift fuer Metallkunde) 98 (2007) Nr. 11, S. 1138-1145 URL

R. Peipmann, J. Thomas, A. Bund: Electrocodeposition of nickel–alumina nanocomposite films under the influence of static magnetic fields, Electrochimica Acta 52 (2007) Nr. 19, S. 5808-5814 URL

D. Reitz, J. Thomas, H. Schmidt, S. Menzel, K. Wetzig, M. Albert, J.W. Bartha: Damascene technique applied to surface acoustic wave devices, Journal of Vacuum Science and Technology B 25 (2007) Nr. 1, S. 271-276 URL

J. Thomas: Nanotechnology – a challenge for solid state analysis, Microchimica Acta 156 (2007) Nr. 1-2, S. 3-8 URL

L. Wilde, J. Schumann, J. Thomas, I. Baecher, N. Mattern, T. Gemming, R. Kaltofen, D. Elefant, S. Oswald: Microstructure of Co2CrxFe1-xAl thin films for magneto-electronic applications, Thin Solid Films 515 (2007) Nr. 17, S. 6781-6790 URL

2006

K. Leistner, S. Oswald, J. Thomas, S. Faehler, H. Schloerb, L. Schultz: Potential dependence of composition and structure of electrodeposited Fe–Pt films, Electrochimica Acta 52 (2006) Nr. 1, S. 194-199 URL

2005

R. Kaltofen, I. Moench, J. Schumann, D. Elefant, S. Zotova, J. Thomas, H. Vinzelberg: Magnetotransport properties and thermal stability of magnetic tunnel junctions with wave resonance plasma oxidized barrier, Journal of Magnetism and Magnetic Materials 290-291 (2005) Nr. Part 2, S. 1146-1149 URL

K. Leistner, J. Thomas, S. Baunack, H. Schloerb, L. Schultz, S. Faehler: Influence of oxygen and copper in electrodeposited FePt films, Journal of Magnetism and Magnetic Materials 290-291 (2005) Nr. Part 2, S. 1270-1273 URL

A. Leonhardt, H. Liepack, K. Biedermann, J. Thomas: Synthesis of SiC nanorods by chemical vapor deposition, Fullerenes, Nanotubes and Carbon Nanostructures 13 (2005) Nr. Suppl. 1, S. 91-97

L. Roentzsch, K.-H. Heinig, B. Schmidt, A. Muecklich, W. Moeller, J. Thomas, T. Gemming: Direct evidence of self-aligned Si nanocrystals formed by ion irradiation of Si/SiO2 interfaces, Physica Status Solidi A 202 (2005) Nr. 15, S. R170-R172 URL

J. Thomas, T. Gemming: Shells on nanowires detected by analytical TEM, Applied Surface Science 252 (2005) Nr. 1, S. 245-251 URL

J. Thomas, J. Schumann, M. Domankova, T. Gemming: Microstructure and phase formation of Heusler thin film compounds, Zeitschrift fuer Metallkunde 96 (2005) Nr. 9, S. 1015-1023

K. Wetzig, J. Thomas: Nanoscaled multilayers for magnetoelectronics - characterised by analytical TEM, Zeitschrift fuer Metallkunde 96 (2005) Nr. 3, S. 242-248

T.G. Woodcock, M. Kusy, S. Mato, G. Alcala, J. Thomas, W. Loeser, A. Gebert, J. Eckert, L. Schultz: Formation of a metastable eutectic during the solidification of the alloy Ti60Cu14Ni12Sn4Ta10, Acta Materialia 53 (2005) Nr. 19, S. 5141-5149 URL

2004

W. Brueckner, J. Thomas, R. Hertel, R. Schaefer, C.M. Schneider: Magnetic domains in a textured Co nanowire, Journal of Magnetism and Magnetic Materials 283 (2004) Nr. 1, S. 82-88 URL

S. Groudeva-Zotova, D. Elefant, R. Kaltofen, J. Thomas, C.M. Schneider: NiMn/FeNi exchange biasing systems–magnetic and structural characteristics after short annealing close to the phase transition point of the AFM layer, Journal of Magnetism and Magnetic Materials 278 (2004) Nr. 3, S. 379-391 URL

A. Kirchner, J. Thomas, O. Gutfleisch, D. Hinz, K.-H. Mueller, L. Schultz: HRTEM studies of grain boundaries in die-upset Nd-Fe-Co-Ga-B magnets, Journal of Alloys and Compounds 365 (2004) Nr. 1-2, S. 286-290 URL

K. Leistner, J. Thomas, H. Schloerb, M. Weisheit, L. Schultz, S. Faehler: Highly coercive electrodeposited FePt films by postannealing in hydrogen, Applied Physics Letters 85 (2004) Nr. 16, S. 3498-3500 URL

J. Thomas, R. Reiche, H. Vinzelberg: Analytical investigations of tunnel magnetoresistance layers, Analytical and Bioanalytical Chemistry 379 (2004) Nr. 4, S. 576-581 URL

2003

W. Brueckner, R. Kaltofen, J. Thomas, M. Hecker, M. Uhlemann, S. Oswald, D. Elefant, C.M. Schneider: Stress development in sputtered NiO thin films during heat treatment, Journal of Applied Physics 94 (2003) Nr. 8, S. 4853-4858 URL

A. Cziraki, M. Koeteles, L. Peter, Z. Kupay, J. Padar, L. Pogany, I. Bakonyi, M. Uhlemann, M. Herrich, B. Arnold, J. Thomas, H.D. Bauer, K. Wetzig: Correlation between interface structure and giant magnetoresistance in electrodeposited Co-Cu/Cu multilayers, Thin Solid Films 433 (2003) Nr. 1-2, S. 237-242 URL

A. Cziraki, L. Peter, B. Arnold, J. Thomas, H.-D. Bauer, K. Wetzig, I. Bakonyi: Structural evolution during growth of electrodeposited Co-Cu/ Cu multilayers with giant magnetoresistance, Thin Solid Films 424 (2003) Nr. 2, S. 229-238 URL

S. Groudeva-Zotova, D. Elefant, R. Kaltofen, D. Tietjen, J. Thomas, V. Hoffmann, C.M. Schneider: Magnetic and structural characteristics of exchange biasing systems based on NiMn antiferromagnetic films, Journal of Magnetism and Magnetic Materials 263 (2003) Nr. 1-2, S. 57-71 URL

M. Hecker, J. Thomas, D. Tietjen, S. Baunack, C.M. Schneider, An Qiu, N. Cramer, R.E. Camley, Z. Celinski: Thermally induced modification of GMR in Co/ Cu multilayers: correlation among structural, transport and magnetic properties, Journal of Physics D 36 (2003) Nr. 5, S. 564-572 URL

J. Thomas, J. Schumann, C. Kleint: Measurement of the perfection of nanoscale multilayers, Analytical and Bioanalytical Chemistry 376 (2003) Nr. 5, S. 647-652 URL

2002

W. Brueckner, S. Baunack, J. Thomas, M. Hecker, C.M. Schneider: Interdiffusion, stress, and microstructure evolution during annealing in Co/Cu/Co trilayers , Journal of Applied Physics 91 (2002) Nr. 12, S. 9696-9700 URL

V. Neu, J. Thomas, S. Faehler, B. Holzapfel, L. Schultz: Hard magnetic SmCo thin films prepared by pulsed laser deposition, Journal of Magnetism and Magnetic Materials 242-245 (2002), S. 1290-1293 URL

C.M. Schneider, D. Elefant, D. Tietjen, H. Vinzelberg, R. Kaltofen, S. Zotova, J. Thomas, M. Hecker, I. Moench: Magnetoelektronik, Vakuum in Forschung und Praxis 14 (2002), S. 139-148

J. Thomas, D. Hofman, C. Kleint, J. Schumann, K. Wetzig: Nanostructure and thermoelectric properties of ReSi2+x thin films, Analytical and Bioanalytical Chemistry 374 (2002) Nr. 4, S. 695-698 URL

2001

M. Bobeth, M. Hecker, W. Pompe, C.M. Schneider, J. Thomas, A. Ullrich, K. Wetzig: Thermal stability of nanoscale Co/Cu multilayers, Zeitschrift fuer Metallkunde 92 (2001) Nr. 7, S. 810-819

W. Brueckner, J. Thomas, C.M. Schneider: Evolution of stress and microstructure in NiFe (20wt%) thin films during annealing, Thin Solid Films 385 (2001) Nr. 1/2, S. 225-229 URL

W. Brueckner, S. Baunack, M. Hecker, J. Thomas, S. Groudeva-Zotova, C.M. Schneider: Oxidation of NiFe(20 wt.%) thin films, Materials Science and Engineering B 86 (2001) Nr. 3, S. 272-275 URL

J. Frey, A. Schoenecker, F. Schlenkrich, J. Thomas, W. Hermel: Investigation of interlayer phenomena in Ti/Pt electrodes for ferroelectric thin film devices, Zeitschrift fuer Metallkunde 92 (2001) Nr. 2, S. 141-144

J. Thomas, T. Fliervoet, K. Wetzig: Analysis of nanoscale multilayers by EDXS and EELS in the STEM, Applied Surface Science 179 (2001) Nr. 1-4, S. 61-67 URL

K. Wetzig, J. Thomas: Nanoanalytical investigations of functional materials by transmission electron microscopy, Praktische Metallographie 38 (2001) Nr. 11, S. 627-636

K. Wetzig, J. Thomas, H.-D. Bauer: Analytical TEM for the investigation of thin functional layers, Applied Surface Science 179 (2001) Nr. 1-4, S. 143-149 URL

K. Wetzig, J. Thomas, H.-D. Bauer, M. Hecker, A. John: TEM-EELS investigations of nanoscale multilayers in the linescan mode, Journal of Electron Spectroscopy and Related Phenomena 114-116 (2001), S. 1019-1023 URL

2000

W. Brueckner, V. Weihnacht, W. Pitschke, J. Thomas, S. Baunack: Abnormal grain growth of sputtered CuNi(Mn) thin films, Journal of Materials Research 15 (2000) Nr. 5, S. 1062-1068 URL

W. Brueckner, W. Pitschke, J. Thomas, G. Leitner: Stress, resistance, and phase transitions in NiCr(60 wt%) thin films, Journal of Applied Physics 87 (2000) Nr. 5, S. 2219-2226 URL

D. Hofman, C. Kleint, J. Thomas, K. Wetzig: Investigation of thermoelectric silicide thin films by means of analytical transmission electron microscopy, Ultramicroscopy 81 (2000) Nr. 3/4, S. 271-277

L. van Loyen, D. Elefant, D. Tietjen, C.M. Schneider, M. Hecker, J. Thomas: Annealing of Ni80Fe20/Cu and Co/Cu multilayers, Journal of Applied Physics 87 (2000) Nr. 9, S. 4852-4854 URL

J. Thomas, A. John, K. Wetzig: Nanoscale Co/Cu multilayers investigated by analytical TEM and AES, Mikrochimica Acta 133 (2000) Nr. 1-4, S. 131-135 URL

J. Thomas, H.-D. Bauer, S. Baunack, K. Wetzig: Investigations on nanoscale multilayers by analytical TEM in scanning mode, Crystal Research and Technology 35 (2000) Nr. 6-7, S. 839-849 URL

1999

N. Balchev, V. Kovachev, J. Thomas, W. Bieger, K. Konstantinov, B. Kunev: Superconducting Cd and Ca doped 123 phase in Cd0.8Ba2(Y0.7Ca0.4)Cu3.5Oy, Bulgarian Journal of Physics 26 (1999) Nr. 1/2, S. 71-75

S. Baunack, W. Brueckner, W. Pitschke, J. Thomas: Auger electron spectroscopy study of interdiffusion, oxidation and segregation during thermal treatment of NiCr/CuNi(Mn)/NiCr thin films, Applied Surface Science 145 (1999), S. 216-221 URL

W. Brueckner, W. Pitschke, S. Baunack, J. Thomas: Mechanical stress, grain-boundary relaxation, and oxidation of sputtered CuNi(Mn) films, Journal of Materials Research 14 (1999) Nr. 4, S. 1286-1294 URL

J. Noetzel, A. Handstein, A. Muecklich, F. Prokert, H. Reuther, J. Thomas, E. Wieser, W. Moeller: Co/Cu solid solution prepared by ion implantation, Journal of Magnetism and Magnetic Materials 205 (1999) Nr. 2-3, S. 177-183 URL

R. Reiche, S. Oswald, D. Hofman, J. Thomas, K. Wetzig: Bombardment-induced silicide formation at rhenium-silicon interfaces studied by XPS and TEM, Fresenius Journal of Analytical Chemistry 365 (1999) Nr. 1-3, S. 76-82

J. Thomas, K. Brand, A.A. Gorbunov, K. Wetzig: Morphology and structure of nanoscale Co-Cu multilayers, Fresenius Journal of Analytical Chemistry 365 (1999) Nr. 1-3, S. 263-268

1998

H.-D. Bauer, R. Rennekamp, J. Thomas: Nanostructure investigations with the analytical transmission electron microscope, Fresenius Journal of Analytical Chemistry 361 (1998), S. 515-521

W. Bieger, G. Krabbes, P. Schaetzle, A. Leistikow, J. Thomas, P. Verges: Modified processing, microstructure and improved properties of NdBaCuO bulk materials, Materials Science and Engineering B 53 (1998) Nr. 1-2, S. 100-103 URL

R. Kurt, W. Pitschke, J. Thomas, H. Wendrock, W. Brueckner, K. Wetzig: Investigation of the microstructure of IrSix thin films, Fresenius Journal of Analytical Chemistry 361 (1998) Nr. 6-7, S. 609-613

A. Leonhardt, H. Grueger, D. Selbmann, B. Arnold, J. Thomas: Preparation of CNx phases using plasma-assisted and hot filament chemical vapour deposition, Thin Solid Films 332 (1998) Nr. 1-2, S. 69-73 URL

R. Rennekamp, J. Thomas, B. Arnold, K. Suenaga: Characterization of Fe/Cr multilayers by analytical transmission electron microscopy, Fresenius Journal of Analytical Chemistry 361 (1998) Nr. 6-7, S. 621-625

J. Thomas, R. Rennekamp, L. van Loyen: Characterization of multilayers by means of EDXS in the analytical TEM, Fresenius Journal of Analytical Chemistry 361 (1998) Nr. 6-7, S. 633-636

1997

M. Bobeth, R. Krawietz, H. Mai, W. Pompe, A. Sewing, J. Thomas: Morphological transition in Ni/C nanoscale multilayers, Solid State Ionics 101-103 (1997), S. 279-284 URL

A.A. Gorbunov, J. Richter, W. Pompe, A. Sewing, J. Thomas: STM induced annealing and nanoextrusion in nm-period multilayers, Surface and Interface Analysis 25 (1997) Nr. 7-8, S. 596

R. Kurt, W. Pitschke, A. Heinrich, J. Schumann, J. Thomas, K. Wetzig, A. Burkov: Phase formation process of IrxSi1-x thin films - structure and electrical properties, Thin Solid Films 310 (1997) Nr. 1-2, S. 8-18 URL

J. Thomas, J. Schumann, W. Pitschke: Characterization of rhenium-silicon thin films, Fresenius Journal of Analytical Chemistry 358 (1997) Nr. 1-2, S. 325-328 URL

J. Thomas: Analytical TEM investigations of high-temperature superconductors, Mikrochimica Acta 125 (1997) Nr. 1-4, S. 307-311 URL

Contributions to collected editions/proceedings

2011

D. Haase, S. Hampel, K. Kraemer, D. Kunze, A. Taylor, M. Arlt, J. Thomas, S. Oswald, M. Ritschel, R. Klingeler, A. Leonhardt, B. Buechner: Carbon nanotubes filled with carboplatin: Towards carbon nanotube-supported delivery of chemotherapeutic agents, in: Carbon Nanotubes for Biomedical Applications, R. Klingeler, R.B. Sim (eds.), Springer-Verl., 2011, 247-258 (2011)

2009

R. Mueller, M. Bobeth, H. Brumm, G. Gille, W. Pompe, J. Thomas: Formation of nanostructured tantalum during Mg-vapour reduction of tantalum oxide, International Conference on Advanced Processing for Novel Functional Materials - APNFM 2008, Dresden, 23.-25.1.08, in: Proceedings, Y. Grin, B. Kieback, J. Schmidt (eds.), 85-90 (2009)

J. Thomas, J. Schumann, T. Gemming, J. Eckert: TEM investigation of electron beam evaporated epitaxial Fe3Si films on GaAs (100) substrates, Microscopy Conference 2009 (MC2009), Graz/ Oesterreich, 30.8.-4.9.09, in: Proceedings, W. Grogger, F. Hofer, P. Poelt (eds.) Verlag der TU Graz/ Oesterreich (2009)

2007

J. Thomas, H. Wendrock, B. Arnold, D. Lohse: FIB preparation of holes with large aspect ratio, Microscopy Conference, Deutsche Gesellschaft fuer Elektronenmikroskopie, 33rd Conference, Saarbruecken, 2.-7.9.07, in: Microscopy and Microanalysis, T. Gemming; U. Hartmann; P. Mestres; P. Walter (eds.), 13, Suppl. 3, 104-105 (2007) URL

J. Thomas, T. Gemming: Determination of phase mixtures by selected area electron diffraction, Microscopy Conference, Deutsche Gesellschaft fuer Elektronenmikroskopie, 33rd Conference, Saarbruecken, 2.-7.9.07, in: Microscopy and Microanalysis, T. Gemming; U. Hartmann; P. Mestres; P. Walter (eds.), 13, Suppl. 3, 134-135 (2007)

2006

M. Hofmann, J. Thomas, T. Gemming, K. Wetzig: Measurement of local lattice parameters and strain gradients in Al and Cu metallizations with CBED, 16th International Microscopy Congress, Sapporo/ Japan, 3.-8.9.06, in: Proceedings, 1011 (2006)

C.M. Schneider, J. Thomas: Thermal stability of magnetoresistive layer stracks, in: Metal Based Thin Films for Electronics, 2nd rev. and englarg. ed.; K.Wetzig ; C.M.Schneider (eds.), 283-294 (2006)

J. Schumann, J. Thomas: Functional electric layers, in: Metal Based Thin Films for Electronics, 2nd rev. and englarg. ed.; K.Wetzig ; C.M.Schneider (eds.), 323-339 (2006)

K. Wetzig, J. Thomas: Electron microscopy and diffraction, in: Metal Based Thin Films for Electronics, 2nd rev. and englarg. ed.; K.Wetzig ; C.M.Schneider (eds.), 160-179 (2006)

2004

M. Hofmann, T. Gemming, J. Thomas, K. Wetzig: CBED on copper and aluminium - a comparison, 13th European Microscopy Congress, EMC, University of Antwerp/ Belgien, 22.-27.8.04, in: Proceedings, D. Schryvers and J.-P. Timmermans (eds.) ; Vol. 1 Instrumentation and Methodology, D. Van Dyck and P. Van Oostveldt (eds.), 177-178 (2004)

A. Kirchner, K. Khlopkov, J. Thomas, O. Gutfleisch, D. Hinz, K.-H. Mueller, L. Schultz: HRTEM studies of grain boundaries in die-upset Nd-based and Pr-based magnets, in: Proceedings of the 18th International Workshop on High Performance Magnets and their Applications, Sept. 2004, Annecy/Frankreich, N.M. Dempsey and P. de Rango (eds.), 275-281 (2004)

J. Thomas, J. Schumann, D. Lohse: Analytical TEM investigations on Co-Mn-Si thin films, 13th European Microscopy Congress, EMC, University of Antwerp/ Belgien, 22.-27.8.04, in: Proceedings, D. Schryvers and J.-P. Timmermans (eds.) ; Vol. 2, Materials Science, G. Van Tendeloo (ed.), 669-670 (2004)

2003

C.M. Schneider, J. Thomas: Thermal stability of magnetoresistive layer stacks, in: Metal Based Thin Films for Electronics, K.Wetzig ; C.M.Schneider (eds.), 251-262 (2003)

J. Schumann, J. Thomas: Functional electric layers, in: Metal Based Thin Films for Electronics, K.Wetzig ; C.M.Schneider (eds.), 292-307 (2003)

J. Schumann, C.A. Kleint, H. Vinzelberg, J. Thomas, M. Hecker, J. Nurnus, H. Boettner, A. Lambrecht, C. Kuenzel, F. Voelklein: Micromachined thermoelectric test cevice based on Silicon/Germanium superlattices: Simulation, preparation and characterization of thermoelectric behavior, in: 22nd International Conference on Thermoelectrics, La Grande-Motte, France,17.-21.8.03, in: Proceedings IEEE No. 03TH8726, 677-681 (2003)

J. Thomas, W. Brueckner, C.M. Schneider, K. Wetzig: Analysis of nanoscale Co pillars by means of ATEM, Microscopy Conference Dresden 2003, in: Proceedings, 276-277 (2003)

J. Thomas, H. Vinzelberg, S. Groudeva-Zotova: Analysis of the quality of nanoscale TMR layer stacks, Microscopy Conference Dresden 2003, in: Proceedings, 278-279 (2003)

K. Wetzig, J. Thomas: Electron microscopy and diffraction, in: Metal Based Thin Films for Electronics, K.Wetzig ; C.M.Schneider (eds.), 140-157 (2003)

2002

K. Wetzig, J. Thomas: EFTEM investigations of nanoscale magnetic layers, 15th International Congress on Electron Microscopy (ICEM-15), Durban/Suedafrika, 1.-6.9.02, in: Proceedings, 3, 265-266 (2002)

2001

W. Brueckner, M. Hecker, J. Thomas, D. Tietjen, C.M. Schneider: Magnetostriction and microstructure of as-deposited and annealed Co thin films, Symposium "Applications of ferromagnetic and optical materials, storage and magnetoelectronics", San Francisco/USA, 16.-20.4.01, in: Materials Research Society Symposium Proceedings, 674, T 3.3.1-6 (2001)

K. Wetzig, J. Thomas: Nanoanalytical investigations of functional materials by transmission electron microscopy, European Metallographic Conference and Exhibition, EUROMET 2000, Saarbruecken, 13.-15.9.00, in: "Progress in Metallography", F. Muecklich, Werkstoffinformationsgesellschaft Frankfurt, Sonderbaende der Praktischen Metallographie, 32, 11-17 (2001)

2000

D. Hofman, C. Kleint, J. Thomas, K. Wetzig: Nanostructure of epitaxial ReSi1.75 thin films on Si , 12th European Congress on Electron Microscopy, Brno/Czech Republic, 9.-14.7.00, in: Proceedings Volume II "Physical Sciences", P297-P298 (2000)

J. Thomas, H.-D. Bauer, S. Baunack, K. Wetzig, A. Mensch: Factor analysis of TEM-EEL spectra on nanoscale Fe/Al/Fe layers, 12th European Congress on Electron Microscopy, Brno/Czech Republic, 9.-14.7.00, in: Proceedings Volume III "Instrumentation and Methodology", I 339-I 340 (2000)

1999

H. Griessmann, A. Heinrich, J. Schumann, D. Elefant, W. Pitschke, J. Thomas: Thermoelectric transport properties, structure investigations and application of doped Beta-FeSi2 thin films, Eighteenth International Conference on Thermoelectrics, Baltimore/USA, 29.8.-2.9.99, in: Proceedings, 662-666 (1999)

G. Krabbes, W. Bieger, P. Schaetzle, G. Fuchs, J. Thomas: RE-Ba-Cu-O bulk materials: Thermodynamics, processing, properties control, in: Advances in Solid State Physics , Kramer, B. (ed.), 39, 383-392 (1999)

1998

W. Brueckner, S. Baunack, W. Pitschke, J. Thomas: Development of mechanical stress in CuNi(Mn) films during temperature ramping: Related mechanisms, Symposium on Thin Films - Stresses and Mechanical Properties VII, MRS Fall Meeting, Boston/USA, 1.-5.12.97, in: Materials Research Society Symposium Proceedings, 505, 397-402 (1998)

1997

R. Reiche, S. Oswald, J. Thomas, J. Schumann, K. Wetzig: XPS, AES, TEM and SEM investigations on Ar profiled metal-silicon thin films, ECASIA'97, Goeteborg/Schweden, 16.-20.6.97, in: 7th European Conference on Applications of Surface and Interface Analysis, John Wiley & Sons, Chichester, 456-459 (1997)

1996

H.-D. Bauer, R. Rennekamp, J. Thomas: Nanoanalytik mit dem Raster-TEM, 17. Tagung des DVM-AK "REM in der Werkstoffpruefung", Halle, 27.-29.3.96, in: DVM-Bericht Nr. 517, 107-112 (1996)

W. Pitschke, R. Kurt, A. Heinrich, J. Schumann, J. Thomas, M. Maeder: Structure and phase formation in amorphous Ir-Si thin films at high temperatures, XVth International Conference on Thermoelectrics'96, Pasadena/USA , in: Proceedings, IEEE TH8169, 499-503 (1996)

Invited talks

2016

J. Thomas, T. Gemming, K. Wetzig: Analysis of Nanostructures by Analytical TEM, EFDS Workshop "Von Nano bis Makro: Bildgebende Untersuchungsverfahren für Qualitätskontrolle und Materialforschung", Dresden/ Germany, 8.-9.11.16 (2016)

2012

J. Thomas, D. Lohse, T. Gemming: Verbesserung der Qualitaet von FIB-Lamellen durch Beschuss mit Ar-Ionen geringer Energie, Anwendertreffen "Festkoerperpraeparation", Chemnitz, 7.-8.3.12 (2012)

J. Thomas, D. Lohse, T. Gemming: Qualitaetsverbesserung von FIB-Lamellen durch Ar-Ionenduennen mit geringer Energie, Workshop TEM-Praeparation Berlin-Brandenburg-Sachsen, Dresden, 20.4.12 (2012)

2011

J. Thomas, J. Ramm, T. Gemming: Elektronenbeugung zur Analyse duenner Funktionsschichten - ein Ueberblick, Workshop EFDS "Moderne Methoden der Oberflaechen- und Duennschichtanalytik", Dresden, 29.-30.11.11 (2011)

J. Thomas, J. Ramm, T. Gemming: Elektronenbeugung zur Analyse duenner Funktionsschichten: Eine moderne Methode?, 16. Tagung Festkoerperanalytik, Wien/ Oesterreich, 4.-6.7.11 (2011)

2008

N. Mattern, T. Gemming, J. Thomas, G. Goeringk, H. Franz, J. Eckert: Phase separation in Ni-Nb-Y metallic glasses, ISMANAM2008, Buenos Aires/ Argentinien, 6.-10.7.08 (2008)

2007

S. Hampel, D. Kunze, D. Haase, K. Kraemer, A. Leonhardt, M. Ritschel, J. Thomas, S. Oswald, V. Hoffmann, B. Buechner: Drugfilled multiwalled carbon nanotubes – a nanosized drug carrier system, Carbio-Meeting, Dresden, 11.-14.12.07 (2007)

2005

M. Hofmann, J. Thomas, T. Gemming, K. Wetzig: Convergent- beam electron diffraction on metallizations, Seminar AMD Dresden, 19.7.05 (2005)

J. Thomas: Nanotechnologie- eine Herausforderung fuer die Festkoerperanalytik, 13. Tagung Festkoerperanalytik, Chemnitz, 27.6.05 (2005)

K. Wetzig, J. Thomas: Nanoanalytik an duennen Sensorschichten, Gruendungsveranstaltung des IfOM an der Westsaechsischen Hochschule Zwickau, 14.10.05 (2005)

2004

K. Wetzig, J. Thomas: Nanoanalytical characterization of electronic functional layers, Kolloquiumvortrag am MPI Stuttgart, 7.6.04 (2004)

K. Wetzig, J. Thomas: Nanoscaled multilayers for magnetoelectronics characterized by analytical TEM, Koreanisch-Deutsches Symposium "Interfaces in Solids", RWTH Aachen, 21.-23.3.04 (2004)

2003

J. Thomas: Morphology and magnetic structures in nanoscaled Co/ Cu layers, European Meeting "Quantitative Microscopy", Grenoble/Frankreich, 11.-14.3.03 (2003)

2002

J. Thomas: Elementanalytik an nanoskaligen Schichtsystemen im analytischen TEM, Workshop "Elektronenmikroskopie" der Deutschen Gesellschaft fuer Kristallografie, Kiel, 7.3.02 (2002)

K. Wetzig, J. Thomas: Moeglichkeiten und Grenzen der Transmissionselektronenmikroskopie in der Duennschichtanalytik, DPG-Fruehjahrstagung, Regenburg, 11.-15.3.02 (2002)

2001

H.-D. Bauer, J. Thomas: Neue Moeglichkeiten der analytischen TEM am IFW Dresden, Institut IAPD, Fachrichtung Physik, TU Dresden, 10.7.01 (2001)

H.-D. Bauer, J. Thomas: Das TEM TecnaiF30: Hochaufgeloeste Abbildung und/oder Analytik?, Kolloquium im TU-Institut IKFP, Dresden, 16.10.01 (2001)

2000

J. Thomas, B. Arnold, H.-D. Bauer: Analytical TEM on nanoscale Co/Cu multilayers: An experimental challenge, Institute of Physics, Department of Solid State Physics, Eoetvoes Lorand University, Budapest/Ungarn, 28.11.00 (2000)

J. Thomas, T. Fliervoet, B. Freitag: Philips FEG TEMs zur Untersuchung nanoskaliger Co/Cu-Vielfachschichten, FEG User Meeting 2000, Dresden, 6.12.00 (2000)

1998

R. Reiche, S. Oswald, D. Hofman, J. Thomas, K. Wetzig: Rhenium-silicon interfaces studied by TEM cross-sectioning and XPS depth profile factor analysis, 10. Arbeitstagung "Angewandte Oberflaechenanalytik", Kaiserslautern, 6.-10.9.98 (1998)

J. Thomas: Untersuchungen zur Morphologie und Struktur nanoskaliger Cr-Cu-Schichten mit dem analytischen TEM, Philips FEG User Meeting, Goettingen, Dez. '98 (1998)

1997

H.-D. Bauer, R. Rennekamp, J. Thomas: Nanostrukturuntersuchungen mit dem analytischen TEM, 9. Tagung Festkoerperanalytik, Chemnitz (1997)

H.-D. Bauer, J. Thomas: Energiespektroskopische Abbildung im STEM, Field Emission Gun, TEM-Workshop, Eindhoven, NL, 7.12.-9.12.97 (1997)

1996

H.-D. Bauer, R. Rennekamp, J. Thomas: Nanoanalytik mit dem Raster-TEM, 17. Tagung des AK Rastermikroskopie der DVM, Halle, 27.-29.3.96 (1996)

Monographs

2014

J. Thomas, T. Gemming: Analytical transmission electron microscopy - An introduction for operators, Springer-Verl., 2014, 382 S.

2013

J. Thomas, T. Gemming: Analytische Transmissionselektronenmikroskopie: Eine Einfuehrung fuer den Praktiker, Springer-Verl., 2013, 363 S. URL