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Microphotoluminescence spectroscopy of single CdTe/ZnTe quantum dots grown on Si(001) substrates

  H. S. Lee, A. Rastelli, M. Benyoucef, F. Ding, T. W. Kim, H. L. Park, O. G. Schmidt
Nanotechnology 20, 075705 (2009) URL PDF
 
  Abtract  
  We have studied the emission properties of single CdTe/ZnTe quantum dots (QDs) grown on Si(001) substrates by using molecular beam epitaxy and atomic layer epitaxy. The good quality of the QDs is attested by the resolution-limited emission, negligible background and absence of measurable spectral jitter or blinking. Power-dependent, polarization-dependent, and temperature-dependent microphotoluminescence spectroscopy measurements were performed to identify the exciton, the biexciton, and two oppositely charged excitons in the emission spectra of single QDs.  
Director
Prof. Dr. Oliver G. Schmidt
IFW Dresden
Postfach 27 01 16
D-01171 Dresden

 

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