Research Topics

Analytical Methods:

• Optimization of ARXPS for various applications
• Computer simulation of roughness for angle-resolved XPS
• Determination of local valence of transition metals by ELNES
• Atomistic and electronic structure of interfaces
• Highly localized strain measurements by CBED
• XPS-Analysis of insulating thin films
• Development of special hardware for RF-GD-OES
• Optimization of a GD-OES Source for the Measurement of Thin Layers
• Atomistic structure determination by incoherent electron scattering
• Application of chemometrics to electron spectra

Materials and Devices for Microelectronics:

• Diffusion Barriers
• Electromigration in interconnects
• Analysis of defects in interconnects by the Auger microprobe: Local analysis, Elemental mapping
• SAW Devices and damage processes by acoustomigration
• Microstructure of Al/Ti metallization layers for SAW
• Structural investigation of functional multilayers for GMR and TMR applications

Deposition processes:

• Cu Deposition for microelectronic applications
• Deposition of Cu-based alloys
• Investigations at insulating thin films using XPS
  
• Investigation of diffusion and reaction in thin films. Example: Depth profile analysis of electrodeposited CoPt films

Nanostructures:

• HRTEM Imaging for improving or monitoring synthesis of novel or standard, organic or inorganic nanotubes or nanowires
• Metal coating of Carbon-nanotubes
• Manipulation of individual Nanotubes
• Patterning and structuring of Materials
• Applications
• Surface segregation at fine oxide powders

Composite Materials:

• Phase Composition
• Nearest neighbour correlations
• Microstructure
• SIMS measurements of oxygen content in the Nd₂Fe₁₄B phase