Analytical Methods
Examples of research projects carried out:
- Spectrometric solid state analysis
- Hardware developments for RF-GD-OES
- Thin film analysis by DC/RF-GD-OES
- Highly localized strain measurements by CBED
- Atomistic structure determination by inelastic electron scattering
- Optimization of XPS for various applications
- Computer simulation of nanostructured surfaces for angle-resolved XPS
- Determination of local valence of transition metals by ELNES
- XPS analysis of insulating thin films