Department Micro- and Nanostructures

Head of the department

Dr. Thomas Gemming
Tel.: +49 (351) 4659 298 / Fax.: +49 (351) 4659 9298
e-mail: t.gemming at the ifw-dresden.de
Postal delivery: Dr. T. Gemming, IFW Dresden, PF 27 01 16, 01171 DRESDEN, GERMANY
Visitors: Helmholtzstr. 20, D-01069 Dresden, Room A 2E.09/10

Research Topics

In our department, micro- and nanostructured materials and devices are investigated. This ranges from the basic interaction of Fe with C, the deposition of metals films by various methods up to functional devices and applications based on surface acoustic wave (SAW) technology. Furthermore, modern transmission electron microscopy (TEM) is used to image and characterize nano structured materials on a nanometer scale. The spectroscopic methods we use are Energy Dispersive X-ray Spectroscopy (EDXS) and Electron Energy Loss Spectroscopy (EELS and ELNES). Material classes include thin metallic films, multi layers having special magnetic or electronic properties, molecular nanostructures like graphene or carbon nanotubes, and other interesting materials. Also various in-situ experiments are carried out in the electron microscopes.

Research projects, cooperations, and results 

 

For a summary of research topics follow this link

 

Methods applied in our group

With modern analytical transmission electron microscopes Tecnai F30 (FEI) and CM20 FEG (Philips) we measure both the geometrical as well as the chemical micro- and even nanostructure of materials. Results can be obtained on:

  • the geometric structure (morphology) and the atomistic arrangements with conventional transmission electron microscopy (CTEM), high-resolution transmission electron microscopy (HRTEM) and scanning transmission electron microscopy (BF-/DF-STEM)
  • the local crystal structure from electron diffraction (ED) and energy filtered convergent beam electron diffraction (CBED). This gives information about the spacegroup and the lattice of crystals. Additionally radial density distribution functions (RDF) of amorphous materials can be derived.
  • the local elemental distribution (chemistry) of heavy elements with energy dispersive X-ray spectroscopy (EDXS) and light elements with electron energy-loss spectroscopy (EELS). Additional techniques allow a real space imaging of the elemental distribution (ESI) and the information of the local bonding of the elements by analysis of the electron energy-loss near edge structure (ELNES).

 

Vorlesung über Hochauflösende Mikroskopie (TEM) WS 2014/15

Donnerstags, 4. DS (13:00-14:30) im IFW Dresden, Helmholtzstr. 20, Raum D2E.27

Start: 16. Oktober 2014

Vorlesung mit begleitendem Praktikum

Vorlesungsankündigung "Hochauflösende Mikroskopie" WS 2014/15 als pdf (noch nicht verfügbar)

Praktikumsanleitung zur Röntgenspektroskopie

Praktikumsanleitung zur Hochauflösenden Mikroskopie

Corrections for the book "Analytical Transmission Electron Microscopy"