TUW will perform benchmarking experiments on the optimal defect structure for flux pinning in HTS, thus indicating possible routes for modifying the production processes. ICMAB will establish a close connection between electrical properties and microstructure in order to identify the influence of different sorts of defects. All characterization work is aimed at assessing the degree of texture, the role of granularity and current percolation as well as the flux pinning action of certain defect structures at the level of a few nm. Angular field measurements of transport currents (UCAM) will provide critical information on the directionality and effectiveness of the different types of pinning centres. Selected sample (bulk as well as films) will be exposed to neutron irradiation (TUW) in order to check, if optimal pinning conditions were achieved during preparation. This work will be accompanied by basic pinning investigations of ILTSR and IEE on MgB2 PIT tapes and coated conductors, which will include the unique characterisation of electrical properties in high magnetic fields. The study of interaction between the nano-defects in superconducting materials and the flux line lattice (which is radically different in layered HTSC and MgB2) will be carried out at steady magnetic fields up to 20 T and the for transport currents up to 500 A at temperatures of liquid helium and nitrogen. Apart from short sample characteristics, longer lengths of tapes and wires will also be characterized with special emphasis on elaborating some standard measurement techniques. This will enable comparison of different materials (for instance for different bending radius). Some additional properties of the materials, which influence pinning (specific heat, thermal transport or linear expansion), will be also studied.