|detection limit:||depends on element, typ: 0.1 at %.|
|sample requirement:||UHV-compatibility (low vapour pressure, no hydrocarbons),|
sample diameter up to 50 mm, max. height 20 mm.
flat surface for depth profiling
|application fields:||surface reactions (oxidation, segregation),|
interface reaction at thin films, film growth,
determination of chemical bonding, chemical valences.
analysis of insulating material,
direct monitoring of electron structure
|materials:||thin films (semiconductors, metals, insulators),|
ceramics, superconductors (density of states),
oxide powders (segregation, surface states),
corroded, surface-modified material (chem. bonding), polymers