Magnetic Force Microscopy (MFM): A method for observing local magnetic fields near a surface by scanning the surface with a magnetic probe which interaction with the magnetic domains on the surface results in a cantilever deflection. Such deflection is used to produce a data file or MFM image.

MFM principle: measurement of frequency shift df


Dr. Volker Neu

phone: +49-351-4659-237
fax:      +49-351-4659-541
e-mail: v.neu(@t)


Dr. Ulrike Wolff

phone: +49-351-4659-721
fax:      +49-351-4659-541
e-mail: u.wolff(@t)