Zeiss Scanning electron microscope (SEM) GEMINI Leo 1530, incl. EDX- and EBSD-system

Scanning electron microscope (SEM) GEMINI Leo 1530, incl. EDX- and EBSD-system

  • Manuf.: Zeiss
  • e--source: Schottky field emission gun
  • Accelerating voltage: 0.2–30 kV
  • High resolution imaging with SE, BSE and InLens-detectors down to 3 nm
  • Magnification: 20X–900,000X
  • 5-axis sample stage enables tilting and rotation
  • Element analysis by EDX (Bruker XFlash 4010)
  • Analysis of grain orientations and structures by EBSD (Bruker e-FlashHR+)
  • Investigations of magnetic samples possible
  • Extensions: heating table up to  500 °C, DDS32 tensile/compression module (K&W), TKD head for EBSD detector
Name of contact person group/department telephone number email address
Prof. Dr. Julia Hufenbach Alloy Design and Processing -152 j.k.hufenbach(at)ifw-dresden.de
Dr. Sergio Scudino Alloy Design and Processing -838 S.Scudino(at)ifw-dresden.de