General Electric Phoenix Nanotom M

X-ray absorbtion CT is a non-destructive imaging method to analyze the inner constitution of solid objects and allows to distinguish between different phases (including defects and pores) due to their different absorbtion properties.

• 180kV Tungsten X-ray tube with macro- and nanofocus mode (for smaller focal spot sizes and higher resolutions)
• Al- and Cu-Filter (0.2 to 1 mm)
• 2D amorphous silicon flat panel detector (DXR500L), 3070x2400 pixel (100µm pixel pitch), CsI scintillator, 500 ms minimum exposer time
• Magnification (geometric-optical) up to 300x
• Voxelsize up to 500 nm (commonly 2 – 6 µm)
• Sample size (diameter): up to 5 mm Fe-based, up to 20 mm Al-based
• Resolution max. 0.5 µm
• Scanmodi: Sectionscan, Fastscan, Singlescan, Multiscan
• Software: GE datos Acquisition 2.0, GE datos Reconstruction 2.0 (with beam hardening correction algorithm), Visual Studio VG Studio max 2.2, FEI AvizoFire 8.1 & 9