- Containerless processing in high-purity environment
- Thermal analysis by infrared pyrometer
- In situ studies of nucleation and crystal growth using high-speed video
- In situ XRD studies of phase formation and transformations using high-energy synchrotron radiation
- Microstructure development upon solidification from different undercooling levels (ex situ sample analysis
Technical characteristics
- Sample environment: vacuum up to 10-8 mbar or inert gas (Ar, He, He/H2)
- Cold trap: additional environment purification
- Carousel sample changer and manipulator
- Sample heating: induction coil and/or laser beam: decoupling of the positioning and temperature control; possibility to process semiconductors
- Temperature: up to ~2000 °C
- Sample cooling: inert gas jet
- High-speed high-resolution video camera (up to 180 000 fps)
- Designed for synchrotron XRD measurements at PETRA III, DESY Hamburg
