We are offering visualisation of magnetic domains (in-plane and out-of-plane) at surfaces of your samples by magneto-optical Kerr microscopy.
| Highest Resolution | 200 nm |
| External magnetic field strength | up to 1 Tesla (depending on sample size and shape) |
| Temperature range | 10 - 800 K |
| Used light | blue, red and white |
| Methods | Direct Kerr, MOIF (magneto-optic indicator films) |
| Local and global measurement of magnetization loops by magneto-optical (MOKE) magnetometry. |
| Quantitative analysis of magnetic domain pattern for thin magnetic films. |
| Analysis of in-plane magnetic anisotropy in magnetic thin and thick films. |
| Domain observation in electrical steel sheets in Epstein geometry (30 x 300 mm, sheet thickness variable) and amorphous and nanocrystalline ribbons of usual geometry. |
I.V. Soldatov & R. Schäfer, Selective sensitivity in Kerr microscopy, Rev. Scient. Instr. 88, 073701, 2017 (https://doi.org/10.1063/1.4991820)
