Nanostructures:

• HRTEM Imaging for improving or monitoring synthesis of novel or standard, organic or inorganic nanotubes or nanowires
• Manipulation of individual Nanotubes
• Metal coating of Carbon-nanotubes
• Patterning and structuring of Materials
• Applications
• Surface segregation at fine oxide powders

Analytical Methods:

• Spectrometric solid state analysis
• Optimization of ARXPS for various applications
• Computer simulation of roughness for angle-resolved XPS
• Determination of local valence of transition metals by ELNES
• Atomistic and electronic structure of interfaces
• Highly localized strain measurements by CBED
• XPS-Analysis of insulating thin films
• Atomistic structure determination by incoherent electron scattering
• Thin film analytics
• Application of chemometrics to electron spectra

Materials and Devices for Microelectronics:

• Diffusion Barriers
• Electromigration in interconnects
• Analysis of defects in interconnects by the Auger microprobe: Local analysis, Elemental mapping
• Structural investigation of functional multilayers for GMR and TMR applications

Deposition processes:

• Metal deposition for microelectronic applications
• Investigations at insulating thin films using XPS
• Investigation of diffusion and reaction in thin films. Example: Depth profile analysis of electrodeposited CoPt films

Composite Materials:

• Phase Composition
• Nearest neighbour correlations
• Microstructure
• SIMS measurements of oxygen content in the Nd2Fe14B phase