At Ruhr University Bochum we have an excellent infrastructure for thin film analysis. A broad variety of methods and devices enables a comprehensive characterization of thin films with respect to composition, structure, and morphology.
Frequently employed, group internally accessible techniques comprise
(grazing incidence) X-ray diffraction (GI-XRD ),
X-ray reflectometry (XRR ),
infrared spectroscopy (IR ),
Filmetrics, UV/Vis spectroscopy,
and contact angle measurements.
At the facilities of our collaboration partners at Ruhr University Bochum we have access to
X-ray photoelectron spectroscopy (XPS ),
Rutherford backscattering spectroscopy and nuclear reaction analysis (RBS/NRA ),
Raman spectroscopy,
ellipsometry, scanning electron microscopy (SEM ),
transmission electron microscopy (TEM ) and
atomic force microscopy (AFM ).
